Unit test on Tuesday (June 9)
Topics: Electromagnetic spectrum, particle vs. wave model of light, reflection and mirrors, ray diagrams for curved mirrors and lenses, ray diagrams for pinhole camera, snell's law and reflection, total internal reflection and critical angle, thin lens equation
Topics: Electromagnetic spectrum, particle vs. wave model of light, reflection and mirrors, ray diagrams for curved mirrors and lenses, ray diagrams for pinhole camera, snell's law and reflection, total internal reflection and critical angle, thin lens equation